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To evaluate the contrast of display devices under ambient light is more practical than in a dark environment
This Test Method covers determination of the average amount of bow of nominally circular silicon wafers
SEMI E1-1110 (Reapproved 0816)
SEMI E54-1296 (technical revision)
M01800 - SEMI M18 - シリコンウェーハ発注仕様書開発のガdイド StdPbc-1022 To evaluate the contrast ofNOTICE: This translation is a REFERENCE COPY ONLY. If differences should exist between the English version and a translation in any other language, the English version is the official and authoritative version. SEMI SEMI Silicon Wafer Global Technical Committee2012830global Audits and Reviews Subcommittee20129www. semiviews. org www. semi. org1990200711 NOTICE: This Standard or Safety Guideline has an Inactive Status because the conditions to maintain
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