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Optional attributes
The purpose of this Standard is to standardize a fast and accurate test method for the content of vinyl acetate (VA) in poly ethylene-vinyl acetate (EVA) using thermal gravimetric analysis (TGA) method
SEMI M40 — Guide for Measurement of roughness of Planar Surfaces on Polished Wafers
SEMI MF1619-1107 (technical revision)
M04100 - SEMI M41 - 電源デバイス／IC用シリコン・オン・インシュレーター（SOI）の仕様 StdPbc-0324 Optional attributesglobal Silicon Wafer Committee2007425global Audits and Reviews Subcommittee20076www. semi. org20077CD ROM20006200111 ICSOI Referenced SEMI Standards SEMI M1 Specifications for Polished Monocrystalline Silicon Wafers SEMI M34 Guide for Specifying SIMOX Wafers SEMI M53 Practice for Calibrating Scanning Surface Inspection Systems Using Certified Depositions of Polystyrene Latex Spheres on Unpatterned
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