Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis best-seller i) Clause 7 generally updated

i)        Clause 7 generally updated for high voltage (HV) and low voltage (LV) cable routes

(ISO 13606-3 defines term lists and reference archetypes

intranets or extranets

from M1 to M56

Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis best-seller i) Clause 7 generally updated1 Scope This Technical Specification establishes methods to characterize the morphology, and to identify the elemental composition of, catalysts and other inorganic impurities in raw and purified single wall carbon nanotube (SWCNT) powders and films, using scanning electron microscopy and energy dispersive X ray spectrometry analysis. The methods described here for SWCNTs can also be applied to the analysis of multiwall carbon nanotubes (MWCNTs).